Bipolar transistor having thin intrinsic base with low base resi

Active solid-state devices (e.g. – transistors – solid-state diode – Integrated circuit structure with electrically isolated... – Including dielectric isolation means

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257588, 257373, H01L 2900, H01L 27082, H01L 27102, H01L 2970

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active

056683960

ABSTRACT:
A bipolar transistor has a first semiconductor region of an n-type epitaxial layer surrounded by a first insulating film, a second insulating film of silicon oxide having an opening, a second semiconductor region as a base link region of a p-type formed in the opening and having a high impurity concentration and a thickness substantially the same as that of the second insulating film, a third semiconductor region as an intrinsic base of a p-type having a thickness thinner than that of the second insulating film, a sidewall insulating film covering the third semiconductor region, and a fourth semiconductor of a p-type formed on the third semiconductor region and surrounded by the side-wall insulating film. The reduction in the thickness of the intrinsic base is achieved without reducing the thickness of the base link region and thus it is possible to realize a bipolar transistor in which a cut-off frequency is high and yet the base resistance is low.

REFERENCES:
patent: 4782030 (1988-11-01), Katsumata et al.
patent: 5073810 (1991-12-01), Owada et al.
patent: 5177583 (1993-01-01), Endo et al.
patent: 5245204 (1993-09-01), Morishita
patent: 5247192 (1993-09-01), Nii
patent: 5323031 (1994-06-01), Shoji et al.
patent: 5374846 (1994-12-01), Takemura
patent: 5402002 (1995-03-01), Meister et al.
patent: 5465006 (1995-11-01), Chen
English Language Abstract of JPA 4-330730 (A).

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