Active solid-state devices (e.g. – transistors – solid-state diode – Heterojunction device – Bipolar transistor
Reexamination Certificate
2006-06-20
2006-06-20
Nguyen, Tuan H. (Department: 2813)
Active solid-state devices (e.g., transistors, solid-state diode
Heterojunction device
Bipolar transistor
C257S201000, C438S312000
Reexamination Certificate
active
07064360
ABSTRACT:
A method is provided to fabricate a bipolar transistor with a low base connection resistance, low defect density and improved scalability. Scalability is to be understood in this case as both the lateral scaling of the emitter window and the vertical scaling of the base width (low temperature budget). The temperature budget can be kept low in the base region since no implantations are required in order to reduce the base connection resistance. Furthermore, the difficulties associated with the point defects are largely avoided.
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Franosch Martin
Meister Thomas
Schaefer Herbert
Stengl Reinhard
Infineon - Technologies AG
Nguyen Tuan H.
Schiff & Hardin LLP
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