Bipolar test probe

Details Bipolar test probe Bipolar test probe

1992-07-01

1995-01-24

Nguyen, Vinh

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

324 725, G01R 3102

Patent

active

053845323

ABSTRACT:
An AC impedance buffer comprising a series of three bipolar transistors in emitter follower configuration is AC coupled to a probe input. An output bipolar transistor has its emitter connected to the output emitter of the AC buffer and its collector provides the probe output. A DC impedance buffer comprises an op amp having inputs connected to the probe input and output and output connected to the base of the output transistor. Another op amp negatively biases the emitter followers so their collectors can be grounded and adds the DC and low frequencies to the AC buffer.

REFERENCES:
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patent: 4646005 (1987-02-01), Ryan
patent: 4743839 (1988-05-01), Rush
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patent: 5049836 (1991-09-01), Christie et al.
Ghausi; "Electronic Devices and Circuits: Discrete and Integrated;" 1985; pp. 209-210.
Hewlett Packard 500 MHz Probe Model No. 1120A, Operating Note, Apr., 1976, pp. 1-17.
Hewlett Packard 500 MHz Probe Model No. 1121A, Operating Note, Jun., 1977.
Tektronix P6201 Probe Instruction Manual, 1972, pp. i, ii, 1-1, 1-2, 3-1, 6-7, 6-8, 6-9.
Tektronix P6202A Probe Instruction Manual, Aug., 1982, pp. 1-1 to 1-7, 2-14, 3-1 to 3-4, 9-1, 9-3, 9-4.
Tektronix P6203 Bipolar Probe 10X, ID Instruction Manual (Preliminary Copy) Jan., 1988, pp. 1-1 to 1-6, 5-1, 5-2, 7-1 to 7-6.
Tektronix P6204 FET Probe 10M 0HM, 10X, ID Instruction Manual, Nov., 1988, pp. 1-1 to 1-6, 5-1, 5-2, 7-1 to 7-6.

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