Optics: measuring and testing – Of light reflection
Reexamination Certificate
2005-10-18
2005-10-18
Rosenberger, Richard A. (Department: 2877)
Optics: measuring and testing
Of light reflection
Reexamination Certificate
active
06956651
ABSTRACT:
Optical Integrated Circuits (OIC) in Surface Plasmon Resonance (SPR) Analysis Systems combined with micorarray or microwell plates to provide enhanced sensitivity, stability, speed of analysis and reduced size are disclosed. Using the OIC with other optical analysis methods to provide enhance analysis systems is also disclosed.
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Gibbons Ian
Kenney John
Lackritz Hilary S.
Ticknor Anthony J.
Amin & Turocy LLP
Lackritz Hilary S.
Rosenberger Richard A.
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