Optical: systems and elements – Binocular devices – Reflected line of sight
Patent
1995-05-01
1996-11-26
Nguyen, Thong
Optical: systems and elements
Binocular devices
Reflected line of sight
359375, 359384, 359407, 359480, 351158, G02B 2702, G02B 2122, G02C 100
Patent
active
055791581
ABSTRACT:
A binocular expanded field of view spectacle mounted microscope including a single microscope provided in front of and mounted to a bridge of a spectacle frame, a first pair of optical path deflectors rotatably connected to the spectacle frame of each side of the bridge of the frame and projecting into a line of sight and visual axis in a direction of the microscope and a second pair of optical path deflectors mounted on the spectacle frame such that a line sight and visual axis from the microscope deflected by the first pair of optical path deflectors is directed towards each eye of a wearer whereby a field of view for each eye is partially overlapped by rotating the first pair of optical path deflectors to provide an expanded field of view including a single zone of binocular vision and a zone of monocular vision on each side of the single zone of binocular vision.
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