Optics: measuring and testing – By dispersed light spectroscopy
Patent
1994-02-02
1995-10-24
McGraw, Vincent P.
Optics: measuring and testing
By dispersed light spectroscopy
356303, 356326, G01J 300
Patent
active
054614759
ABSTRACT:
Apparatus for analyzing a spectral signature, including: a light source; a spatial light modulator connected to the light source, the spatial light modulator modulating light from the light source in accordance with spatial features of the spectral signature; an optic system upon which modulated light from the spatial light modulator is incident, the optic system filtering the modulated light; a hologram illuminated with filtered, modulated light from the optic system, the hologram outputting an optical identification of the spectral signature; and a detector upon which the optical identification is incident, the detector detecting the optical identification.
REFERENCES:
patent: 3717412 (1973-02-01), Takuma et al.
patent: 5039210 (1991-08-01), Welstead et al.
Sheng et al, "Optical N.sup.4 Implementation of a Two Dimensional Wavelet Transform, " Optical Engineering, Sep. 1992, vol. 31, #9, pp. 1859-1863.
Chou Hung
Kostrzewski Andrew
Lerner Jeremy
Lin Shing-Hong F.
Lu Taiwei
Hantis K. P.
McGraw Vincent P.
Physical Optics Corporation
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