Binary inspection probe for numerically controlled machine tools

Details Binary inspection probe for numerically controlled machine tools Binary inspection probe for numerically controlled machine tools

1978-06-13

1978-10-10

Stearns, Richard R.

Geometrical instruments

Area integrators

Electrical

33174L, 318 16, 318574, 364560, G01B 700, G01B 728

Patent

active

041188713

ABSTRACT:
An inspection probe is mounted in the spindle of a numerically controlled machine tool and is moved toward a workpiece therein by the numerical controls until it makes contact with the workpiece. Contact with the workpiece is indicated by change in the output signal of a portable transmitter mounted within the toolholder that carries the inspection probe. The change in output amplitude causes the instantaneous position of the spindle to be recorded in the numerical controls at the instant of contact between the inspection probe and workpiece to indicate the corresponding dimension of the workpiece. Movement of the spindle is stopped after contact between the inspection probe and workpiece to avoid damage to either the inspection probe or the workpiece.

REFERENCES:
patent: 2835042 (1958-05-01), Tandler et al.
patent: 3164909 (1965-01-01), Rosenberg
patent: 3226833 (1966-01-01), Lemelson
patent: 3509635 (1970-05-01), Meinke
patent: 3795054 (1974-03-01), Kinney

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