Bilevel probe

Details Bilevel probe Bilevel probe

2006-09-05

2006-09-05

Patel, Paresh (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S765010

Reexamination Certificate

active

07102371

ABSTRACT:
An apparatus for electrical testing of semiconductor devices is provided. A printed circuit board is provided. A first plurality of probe pins for probing bump connectors is electrically and mechanically connected to the printed circuit board. A second plurality of probe pins for probing probe pads is electrically and mechanically connected to the printed circuit board.

REFERENCES:
patent: 3905098 (1975-09-01), Garretson et al.
patent: 4242152 (1980-12-01), Stone
patent: 4599559 (1986-07-01), Evans
patent: 5554940 (1996-09-01), Hubacher
patent: 5597737 (1997-01-01), Greer et al.
patent: 5629630 (1997-05-01), Thompson et al.
patent: 5893988 (1999-04-01), Tomioka
patent: 6162652 (2000-12-01), Dass et al.
patent: 6181145 (2001-01-01), Tomita et al.
patent: 6229097 (2001-05-01), Suppelsa et al.
patent: 6281111 (2001-08-01), Ohsumi
patent: 6327158 (2001-12-01), Kelkar et al.
patent: 6369407 (2002-04-01), Hikita et al.
patent: 6456099 (2002-09-01), Eldridge et al.
patent: 6534853 (2003-03-01), Liu et al.
patent: 6552555 (2003-04-01), Nuytkens et al.
patent: 6603324 (2003-08-01), Eldridge et al.
patent: 6611458 (2003-08-01), Ishibashi et al.
patent: 6686615 (2004-02-01), Cheng et al.
patent: 6759318 (2004-07-01), Chang
patent: 6798232 (2004-09-01), Lim
patent: 6825052 (2004-11-01), Eldridge et al.
patent: 6869809 (2005-03-01), Yu et al.
patent: 6933524 (2005-08-01), Hembree et al.
patent: 6940093 (2005-09-01), Eldridge et al.
patent: 2001/0052786 (2001-12-01), Eldridge et al.
patent: 2004/0161865 (2004-08-01), Yu et al.
patent: 2005/0007129 (2005-01-01), Pu
patent: 2005/0248011 (2005-11-01), Jung et al.
Kulicke & Soffa Industries, Inc., “Standard Epoxy Cantilever Probe Cards” and “Ceramic Ring Cantilever Probe Cards”, www.kns.com, 2001, 2 pages.

Affiliated with

Also associated with

Rating

Bilevel probe does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Bilevel probe, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Bilevel probe will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-3553699