Electricity: electrical systems and devices – Safety and protection of systems and devices – Load shunting by fault responsive means
Reexamination Certificate
2006-06-27
2006-06-27
Jackson, Stephen W. (Department: 2836)
Electricity: electrical systems and devices
Safety and protection of systems and devices
Load shunting by fault responsive means
Reexamination Certificate
active
07068482
ABSTRACT:
A BiCMOS electrostatic discharge (ESD) protecting circuit is triggered by a bipolar junction transistor (BJT) for achieving ESD protection. Due to the layout area of the BJT ESD protecting circuit being smaller than the layout area of an RC circuit, layout area can be reduced. Moreover, the BJT reduces leakage current problems and has a lower triggering voltage. Therefore, the BJT in the ESD protecting circuit can effectively reduce problems of a higher triggering ESD voltage and leakage current.
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Adel S. Sedra and Kenneth C. Smith “Microelectronic Circuits” CBS College Publishing 1987 pp. 342-345.
Benenson Boris
Jackson Stephen W.
Nixon & Vanderhye PC
United Microelectronics Corp.
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