Electricity: electrical systems and devices – Safety and protection of systems and devices – Load shunting by fault responsive means
Reexamination Certificate
2008-05-27
2008-05-27
Leja, Ronald W. (Department: 2836)
Electricity: electrical systems and devices
Safety and protection of systems and devices
Load shunting by fault responsive means
Reexamination Certificate
active
11287615
ABSTRACT:
An electrostatic discharge protection circuit adapted to reduce an electrostatic discharge event on a line of an integrated circuit. The protection circuit includes an NMOS transistor having a source contact that is electrically connected to the line. A drain contact is electrically connected to a logical low voltage, and a gate contact is also electrically connected to the logical low voltage, through a resistor. A substrate bias pump is electrically connected to a back gate of the NMOS transistor, where the bias pump provides a steady state direct current negative bias during normal operation of the integrated circuit when there is no electrostatic discharge event.
REFERENCES:
patent: 6724592 (2004-04-01), Tong et al.
Charvaka Duvvury et al,Substrate Pump NMOS for ESD Protection Applications, ESD Association, 2000, no month.
Chen Jau-Wen
Liu Minxuan
Loh William M.
Leja Ronald W.
LSI Logic Corporation
Luedeka Neely & Graham
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