Optics: measuring and testing – For optical fiber or waveguide inspection
Patent
1994-03-21
1995-06-06
McGraw, Vincent P.
Optics: measuring and testing
For optical fiber or waveguide inspection
G01N 2123, G01N 2188
Patent
active
054227135
ABSTRACT:
A method for rotationally aligning two bi-refringent waveguides, a single -refringent waveguide and a polarizing fiber or Ti-indifused fiber, and a bi-refringent waveguide and a proton exchange integrated optical chip. The method employs a scanning Michelson interferometer, an ELED light source and an appropriate arrangement of an input polarizer, and output analyzer, necessary coupling lens and a display means for visually observing coherence characteristics of the waveguides during alignment. An Advantest analyzer which contains a scanning Michelson interferometer and display means is used in a preferred embodiment optical arrangement. A set of mathematic relationships applicable to the alignments addressed by the invention is provided. Alignment accuracy as low as .delta..congruent.0.18.degree. is possible.
REFERENCES:
patent: 5245400 (1993-09-01), Anjan et al.
Forrest, Jr. John L.
McGraw Vincent P.
Sliwka Melyin J.
The United states of America as represented by the Secretary of
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