Bi-directional switching circuit

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307465, 364481, 371 1, 371 62, G06F 1520

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active

045569479

ABSTRACT:
A bidirectional switching circuit is provided for testing a large number of AC data paths of LSI macrocell arrays. The circuit includes a plurality of bidirectional pins, a first logic means, and a second logic means. The switching circuit may be used to deskew a general purpose LSI tester wherein any pin may be used for input or output and the pulse at any pin may be inverted. The second logic means, receiving signals on selected pins, initializes the first logic means thereby determining which pins may be used for testing the data path desired.

REFERENCES:
patent: Re31056 (1982-10-01), Chau et al.
patent: 4139147 (1979-02-01), Franke
patent: 4450560 (1984-05-01), Conner
"Deskewing System for Parallel Recorded Data", by A. M. Gindi; IBM Technical Disclosure Bulletin, vol. 10. No. 1; pp. 37-39.

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