Bi-axial probe

Details Bi-axial probe Bi-axial probe

1976-10-01

1979-01-30

Aegerter, Richard E.

Geometrical instruments

Area integrators

Electrical

33143L, 33147N, 33148H, 33172E, G01B 700

Patent

active

041364589

ABSTRACT:
A probe for measuring coordinate positions on an object by sensing a displacement of the stylus which contacts the object. The probe is responsive to forces which result from the contact between the object and the stylus to indicate coordinate positions of the object. The probe includes a replaceable stylus having a shank portion defining an axis, with a transversely-extending portion extending from the shank portion for sensing forces exerted by objects in the axial direction away from the probe, while the stylus shank portion is responsive to forces in the radial and axial (toward the probe) directions. The probe is thus responsive to forces exerted on the stylus in any direction.

REFERENCES:
patent: 3016619 (1962-01-01), Mueller
patent: 3212325 (1965-10-01), Katz et al.
patent: 3520063 (1970-07-01), Rethwish et al.
patent: 3670420 (1972-06-01), Kiewicz
patent: 3673695 (1972-07-01), Rethwish et al.

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