Thermal measuring and testing – Temperature measurement – By electrical or magnetic heat sensor
Reexamination Certificate
2008-01-03
2008-12-09
Lefkowitz, Edward (Department: 2855)
Thermal measuring and testing
Temperature measurement
By electrical or magnetic heat sensor
C327S512000
Reexamination Certificate
active
07461974
ABSTRACT:
An apparatus and method for canceling variations in the beta for a bipolar junction transistor so that the diode equation can be employed to accurately measure the temperature of the transistor based at least in part on a ratio of two target collector currents and two measurements of the base-emitter voltage of the transistor. If the determined collector current of the transistor is relatively equivalent to one of the first and second target collector currents, the transistor's base-emitter voltage is measured and stored. An analog feedback circuit can be employed to change the determined collector current to be relatively equivalent to the first and second target collector currents. The analog feedback circuit can include an optional sample and hold component to further reduce power consumption and reduce noise. A digital circuit can be employed to change the determined collector current to be relatively equivalent to the first and second target collector currents. Additionally, the transistor can be remotely located in another integrated circuit.
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Aslan Mehmet
Branch John W.
Girard & Equitz LLP
Jagan Mirellys
Lefkowitz Edward
National Semiconductor Corporation
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