Bendable conductive connector

Details Bendable conductive connector Bendable conductive connector

2007-05-14

2009-02-17

Tang, Minh N (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S754090, C324S762010

Reexamination Certificate

active

07492177

ABSTRACT:
A conductive connector includes a bendable, shape retainable extension having a first end and a second end. The first end is integral with the probing head. The test point connector is integral with said second end. The test point connector is for making electrical contact with testing points. The present invention may be part of a probing system. The present invention may also include a method for using the conductive connector.

REFERENCES:
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patent: 6400167 (2002-06-01), Gesford et al.
patent: 6404215 (2002-06-01), Nightingale et al.
patent: 6603297 (2003-08-01), Gesford et al.
patent: 6828768 (2004-12-01), McTigue
patent: 7221179 (2007-05-01), Campbell
patent: 2002/0052155 (2002-05-01), Campbell et al.
patent: 2004/0207417 (2004-10-01), Barr
AP033/34—Recomended Accessory Diagram, at least as early as Nov. 7, 2004, 1 page.
Product Specs for Tektronix P6243, from Tucker Electronics web page (www.tucker.com), at least as early as Nov. 7, 2004, 2 pages.
“Differential Probes AP034 AP033”; “LeCroy Oscilloscopes, Protocol Analyzers, and Serial Data Test Solutions 2005/2006 Catalog”; at least as early as Nov. 2005; pages cover, H-18, H-19, and back page; www.lecroy.com.
“Tektronix 016 1885 00”; Test Path Test Accessories web page (http://www.testpath.com/Product.aspx?pn=118-742); at least as early as Jul. 18, 2006; 1 page; www.testpath.com.
“Pogo Pin Repalcement Instructions ICM P/N:P6132298 (For TDR Probes with Spring Loaded Ground Contacts”; http://www.icmicrowave.com/TDR—Probes/B6132298—pogo—pin—instr.pdf; at least as early as Jul. 2006; 4 pages, Inter-Continental Microwave.

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