Bendable conductive connector

Details Bendable conductive connector Bendable conductive connector

2007-05-22

2007-05-22

Tang, Minh N. (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S754090, C324S762010

Reexamination Certificate

active

11019325

ABSTRACT:
A conductive connector includes a bendable, shape retainable extension having a head connector at one end and a test point connector at the opposite end. The head connector is for connecting the conductive connector to a probing head. The test point connector is for making electrical contact with testing points. The present invention may be part of a probing system that includes a probing head. The present invention may also include a method for using the conductive connector.

REFERENCES:
patent: 6191594 (2001-02-01), Nightingale et al.
patent: 6292701 (2001-09-01), Prass et al.
patent: 6400167 (2002-06-01), Gesford et al.
patent: 6404215 (2002-06-01), Nightingale et al.
patent: 6603297 (2003-08-01), Gesford et al.
patent: 6828768 (2004-12-01), McTigue
patent: 2004/0207417 (2004-10-01), Barr
AP033/34—Recomended Accessory Diagram, at least as early as Nov. 7, 2004, 1 page.
Product Specs for Tektronix P6243, from Tucker Electronics web page (www.tucker.com), at least as early as Nov. 7, 2004, 2 pages.
“Differential Probes AP034 AP033”; “LeCroy Oscilloscopes, Protocol Analyzers, and Serial Data Test Solutions 2005/2006 Catalog”; at least as early as Nov. 2005; pages cover, H-18, H-19, and back page; www.lecroy.com.
“Tektronix 016 1885 00”; Test Path Test Accessories web page (http://www.testpath.com/Product.aspx?pn=118-742); at least as early as Jul. 18, 2006; 1 page; www.testpath.com.
“Pogo Pin Repalcement Instructions ICM P/N:P6132298 (For TDR Probes with Spring Loaded Ground Contacts”; http://www.icmicrowave.com/TDR—Probes/B6132298—pogo—pin—instr.pdf; at least as early as Jul. 2006; 4 pages, Inter-Continental Microwave.

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