Below a minute burn-in

Details Below a minute burn-in Below a minute burn-in

1989-06-06

1991-07-09

Wieder, Kenneth

Electricity: measuring and testing

Measuring, testing, or sensing electricity, per se

With rotor

324158D, 324158F, G01R 102

Patent

active

050309056

ABSTRACT:
An electronic component test procedure which can employ a combination of stress, test, and sort techniques useful for consolidating package test, burn-in test and qualification tests. The process can be automated to avoid batch process and virtually eliminate manual handling. Components are sorted according to initial values and mathematical stress models.

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Evaluation Engineering, Sep. 1987, Wasson, James A., pp. 46-48.
Burn-In, Finn Jensen and Niels Erik Petersen, 12/1982, pp. 1-114, John Wiley Sons Ltd.
"Parallel Testing During Burn-In Boosts System Reliability," Electronics Test, Mar. 1987, Buck, Carl et al., pp. 48-53.
"Stress Screening for Improved Reliability," Evaluation Engineering, Feb. 1988, Shalroy, C. E., pp. 74-79.
"Combining Test with Burn In: An Examination of Benefits," Electronics Test, Sep. 1987, Phelps, L., pp. 55-58.
"A Realistic View of Burn-In," Evaluation Engineering, Feb. 1989, Hnatek, E. R., pp. 80-85.
"Cost-Effective ESS of Electronic Hardware", Evaluation Engineering, Feb. 1989, Jacob, G., p. 71.
"Burn-In and Stife Testing," Quality Progress, May 1986, Punches, Ki, pp. 93-94.
"IS Test During Burn-In the Answer", Evaluation Engineering, Jul. 1988, pp. 48-50.
"Conducting Burn-In Without Getting Burned," Electronics Test, May 1987, pp. 53-57, Young, David N.

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