Measuring and testing – Specimen stress or strain – or testing by stress or strain... – Specified electrical sensor or system
Patent
1997-06-02
1999-10-05
Noori, Max
Measuring and testing
Specimen stress or strain, or testing by stress or strain...
Specified electrical sensor or system
73862632, G01B 716, G01L 104
Patent
active
059627921
ABSTRACT:
Disclosed is a beam strain gauge to measure strain in a material which incorporates the theory of beam mechanics and the use of a full Wheatstone bridge circuit. In all cases the beam or beams used are not attached directly to the material to be measured, thereby making the beam or beams insensitive to transverse strain. The use of beam mechanics allows the use of the full Wheatstone bridge circuit, which has many desirable properties for strain measurement. Some of these properties are self compensation for temperature and a higher gauge output signal. The beam strain gauge can be employed using silicon chip technology and provides many advantages over the current conventional strain gauges.
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Grove, R. C., Experimental Stress Analysis and Motion Measurement, pp. 50-75 and 76-133, Charles E. Merrill Publishing Co., Cloumbus, Ohio.
Young, W.C., Roark's Formulas for Stress and Strain, pp. 100-101, sixth edition, McGraw-Hill, Inc.
Timoshenko, S.P., Mechanics of Materials, pp. 125-126, Van Nostrand Reinhold Company.
Monahan Thomas J.
Noori Max
The Penn State Research Foundation
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