Beam profile monitor with accurate horizontal and vertical...

Details Beam profile monitor with accurate horizontal and vertical... Beam profile monitor with accurate horizontal and vertical...

2005-12-06

2005-12-06

Deb, Anjan (Department: 2858)

Electricity: measuring and testing

Determining nonelectric properties by measuring electric...

Beam of atomic particles

C324S071100

Reexamination Certificate

active

06972551

ABSTRACT:
A widely used scanner device that rotates a single helically shaped wire probe in and out of a particle beam at different beamline positions to give a pair of mutually perpendicular beam profiles is modified by the addition of a second wire probe. As a result, a pair of mutually perpendicular beam profiles is obtained at a first beamline position, and a second pair of mutually perpendicular beam profiles is obtained at a second beamline position. The simple modification not only provides more accurate beam profiles, but also provides a measurement of the beam divergence and quality in a single compact device.

REFERENCES:
patent: 3789298 (1974-01-01), Bert
patent: 4878014 (1989-10-01), Simpson
patent: 5224137 (1993-06-01), Plomgren et al.
“Beam Profile Monitors”, Product Bulletin from National Electrostatics Corporation, May 1996, Middleton, WI., 3 pages.

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