Beam positioning arrangement for use in a scanning electron beam

Details Beam positioning arrangement for use in a scanning electron beam Beam positioning arrangement for use in a scanning electron beam

1984-04-05

1986-10-21

Church, Craig E.

X-ray or gamma ray systems or devices

Specific application

Computerized tomography

378205, 378119, 378138, 378137, A61B 608, H01J 3514

Patent

active

046189700

ABSTRACT:
A scanning electron beam computed tomography scanner is disclosed herein and includes means defining a vacuum chamber, means for producing an electron beam at a first location in the chamber and for directing the beam to a second location therein along a particular desired path. A target of a type which produces X-rays as a result of the impingement thereon by the electron beam is positioned at a third location and means at the second location are provided to cause the beam to impinge on the target in a scanning fashion for producing X-rays. The scanner also includes a system for maintaining the electron beam on the desired path between the first and second locations. To this end, the system includes first means acting on the beam between these locations so as to detect for deviations, if any, between the actual path taken by the beam and the desired path and means responsive to these deviations, again if any, for adjusting the position of the electron beam in order to eliminate the deviations.

REFERENCES:
patent: 4075489 (1978-02-01), Neal et al.
patent: 4243888 (1981-01-01), Gruhn et al.
patent: 4352021 (1982-09-01), Boyd et al.

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