Beam-plasma type ion source

Radiant energy – Ion generation – Electron bombardment type

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

3151119, H01J 724, H01J 2700, H05B 3126

Patent

active

039990729

ABSTRACT:
A beam-plasma type ion source comprises a first section for generating an electron beam, a cylindrical second section for ionizing a gas by virtue of electron bombardment caused by the electron beam generated from the first section, a microwave energy transmission circuit disposed in the second section and connected to receive microwave energy in order to cause plasma ionization, and a third section for collecting the electron beam. The gas introduced into the third section is ionized at the second section and extracted by and accelerated in the first section in the opposite direction to the electron beam way. The first section functions to converge an ion beam to generate a well-focused ion beam toward a desired target by means of ions trapped into a negative-potential well due to the electron beam.

REFERENCES:
patent: 3171053 (1965-02-01), Targ et al.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Beam-plasma type ion source does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Beam-plasma type ion source, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Beam-plasma type ion source will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-1840890

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.