Beam generating system for electron beam measuring instruments h

Details Beam generating system for electron beam measuring instruments h Beam generating system for electron beam measuring instruments h

1988-07-15

1990-05-08

Wieder, Kenneth

Electric lamp and discharge devices

Electrode and shield structures

Point source cathodes

313346R, 313292, H01J 118

Patent

active

049241362

ABSTRACT:
Beam generating system for electron beam measuring instruments. In prior art beam generators, the life expectancy of directly heated boride cathodes is limited by their thermally disadvantageous mount. The present invention provides a cathode not clamped at the lower end of the crystal shank as was previously standard, but clamped immediately below the cathode tip. The inventive mount of the boride cathode results in the crystal being only insignificantly hotter in the region of the clamping plane than at the electron-emitting tip.

REFERENCES:
patent: 4430570 (1984-02-01), Takigawa et al.
patent: 4482839 (1984-11-01), Wada et al.
Hohn, "Development and Use of High Brightness Lanthanum Hexaboride Electron Guns", Scanning Electron Micro., 12/1985, pp. 1327-1338.
Schmidt et al, "Design and Optimization of Directly Heated Lab6 Cathode Assemblies for Electron-Beam Inst.", Jul./Aug. 1987, 15(4).

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