Beam current calibration system

Radiant energy – Calibration or standardization methods

Reexamination Certificate

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C250S311000

Reexamination Certificate

active

07982179

ABSTRACT:
A charged particle beam device is described. The charged particle beam device includes an emitter adapted for emitting a primary charged particle beam, a specimen location adapted for holding a specimen, from which secondary and/or backscattered charged particles are released on impingement of the primary charged particle beam, a detection unit adapted for detecting the secondary particles and/or secondary particles, and a beam guiding unit adapted for guiding the primary charged particle beam to the detection unit for impingement of a primary charged particle beam on the detection unit.

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patent: 3842271 (1974-10-01), Gee et al.
patent: 6545277 (2003-04-01), Kella et al.
patent: 7282711 (2007-10-01), Winkler et al.
patent: 2001/0010362 (2001-08-01), Simizu
patent: 2003/0020016 (2003-01-01), Frosien
patent: 2003/0089853 (2003-05-01), Kendall et al.
patent: 0721202 (1996-07-01), None
patent: 04-087244 (1992-03-01), None
patent: 07-105888 (1995-04-01), None

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