Beam control system with extended beacon and method

Radiant energy – Photocells; circuits and apparatus – Photocell controls its own optical systems

Reexamination Certificate

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C356S521000

Reexamination Certificate

active

07041953

ABSTRACT:
A beam control system and method: The inventive system includes, an arrangement for receiving a first beam of electromagnetic energy; measuring wavefront aberrations in the first beam with a wavefront sensor; and removing global tilt from the measured wavefront aberrations to provide higher order aberrations for beam control. In the illustrative embodiment, the invention uses a traditional (quad-cell) Shack-Hartmann wavefront sensor to measure wavefront aberrations. An adaptive optics processor electronically removes the global tilt (angular jitter) from this measurement leaving only the higher-order Zernike components. These higher-order aberrations are then applied to wavefront control elements, such as deformable mirrors or spatial light modulators that correct the tracker image and apply a conjugate distortion to the wavefront of the outgoing HEL beam. A track error (angular jitter) component is supplied by a separate fine track sensor. This jitter error is then applied by the adaptive optics processor to a fast steering mirror, which corrects jitter in the tracker image and applies a compensating distortion to the LOS of the HEL beam.

REFERENCES:
patent: 5287165 (1994-02-01), Ulich et al.
patent: 5745309 (1998-04-01), Slamon
patent: 6278100 (2001-08-01), Friedman et al.
patent: 6563572 (2003-05-01), Radick et al.
patent: 6809307 (2004-10-01), Byren et al.
Tyson and Ulrich, “Adaptive Optics”, The Infrared and Electro-Optical Handbook, vol. 8, Chapter 2, ERIM, Ann Arbor, MI, pp. 165-237; (1963).
Golnick, “Directed Energy Systems”, The Infrared and Electro-Optical Handbook, vol. 8, Chapter 5, ERIM, Ann Arbor, MI, pp. 403-480, (1963).

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