Beam control method and apparatus

Radiant energy – Means to align or position an object relative to a source or...

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2504922, G01N 2113

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active

051342987

ABSTRACT:
A beam control method and apparatus for processing a specimen. A specimen is irradiated with a first beam capable of modifying a property of the specimen. Subsequently, a second beam, incapable of modifying a property of the specimen, irradiates the trace formed by the first beam to thereby identify the actual position of the trace by detecting a signal representing the actual position of the trace. On the basis of comparing actual position of the trace with a desired position of the trace, the latter is controlled.

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patent: 4451738 (1984-05-01), Smith
patent: 4698513 (1987-10-01), Tojo et al.
patent: 4777641 (1988-10-01), Inagaki et al.
patent: 4823012 (1989-04-01), Kosugi
patent: 4823014 (1989-04-01), Miyawaki
patent: 4849901 (1989-07-01), Shimizu
patent: 4866262 (1989-04-01), van der Werf et al.
Katsuhiro Harada, "Current Status of E-Beam Lithography", Bull. Japan Soc. of Prec. Engg., vol.22, No. 4, Dec. 1988, pp. 256-262, (Provided in English).

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