Optics: measuring and testing – Lamp beam direction or pattern
Patent
1998-07-07
1999-08-10
Manuel, George
Optics: measuring and testing
Lamp beam direction or pattern
2502019, 2502081, G01J 100
Patent
active
059367202
ABSTRACT:
An apparatus and method for characterizing an energy beam (such as a laser) with a two-dimensional wavefront sensor, such as a Shack-Hartmann lenslet array. The sensor measures wavefront slope and irradiance of the beam at a single point on the beam and calculates a space-beamwidth product. A detector array such as a charge coupled device camera is preferably employed.
REFERENCES:
patent: 4141652 (1979-02-01), Feinleib
patent: 4399356 (1983-08-01), Feinleib
patent: 4518854 (1985-05-01), Hutchin
patent: 4725138 (1988-02-01), Wirth et al.
patent: 4737621 (1988-04-01), Gonsiorowski et al.
patent: 4882262 (1989-11-01), Wilwerding
patent: 4895790 (1990-01-01), Swanson
patent: 4950878 (1990-08-01), Ulich et al.
patent: 5004573 (1991-04-01), Vlannes
patent: 5078771 (1992-01-01), Wu
patent: 5113064 (1992-05-01), Manhart
patent: 5287165 (1994-02-01), Ulich et al.
patent: 5291333 (1994-03-01), Mills et al.
patent: 5493391 (1996-02-01), Neal et al.
patent: 5629802 (1997-05-01), Clark
Alford W. J.
Gruetzner James K.
Neal Daniel R.
Manuel George
Myers Jeffrey D.
LandOfFree
Beam characterization by wavefront sensor does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Beam characterization by wavefront sensor, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Beam characterization by wavefront sensor will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-1125424