Beam characterization by wavefront sensor

Optics: measuring and testing – Lamp beam direction or pattern

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2502019, 2502081, G01J 100

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active

059367202

ABSTRACT:
An apparatus and method for characterizing an energy beam (such as a laser) with a two-dimensional wavefront sensor, such as a Shack-Hartmann lenslet array. The sensor measures wavefront slope and irradiance of the beam at a single point on the beam and calculates a space-beamwidth product. A detector array such as a charge coupled device camera is preferably employed.

REFERENCES:
patent: 4141652 (1979-02-01), Feinleib
patent: 4399356 (1983-08-01), Feinleib
patent: 4518854 (1985-05-01), Hutchin
patent: 4725138 (1988-02-01), Wirth et al.
patent: 4737621 (1988-04-01), Gonsiorowski et al.
patent: 4882262 (1989-11-01), Wilwerding
patent: 4895790 (1990-01-01), Swanson
patent: 4950878 (1990-08-01), Ulich et al.
patent: 5004573 (1991-04-01), Vlannes
patent: 5078771 (1992-01-01), Wu
patent: 5113064 (1992-05-01), Manhart
patent: 5287165 (1994-02-01), Ulich et al.
patent: 5291333 (1994-03-01), Mills et al.
patent: 5493391 (1996-02-01), Neal et al.
patent: 5629802 (1997-05-01), Clark

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