Beam assembly method for large area array multi-beam DUT...

Metal working – Method of mechanical manufacture – Electrical device making

Reexamination Certificate

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C324S754090

Reexamination Certificate

active

07637006

ABSTRACT:
A method for fabricating beams for a probe card includes dividing a large beam panel into smaller sub-panels before attaching the beams to corresponding posts on a substrate. Each sub-panel may have a sufficient number of beams to test several devices under test. The beam sub-panels may be aligned to the space transformer using alignment fiducials on the beam sub-panels that correspond to opposing alignment features formed in the space transformer or other substrate. Special tie-bars may be formed between: (1) rows, for example, of beams and the frame/frame splines (i.e., quadrant tie-bars); and (2) adjacent beams within any such rows on the beam panel (i.e., beam tie-bars). The approach may also include the use of tip tie-bars and/or tail tie-bars.

REFERENCES:
patent: 6657448 (2003-12-01), Hasegawa
patent: 2001/0016437 (2001-08-01), Hasegawa
patent: 2002/0014704 (2002-02-01), Horie
patent: 2002/0053734 (2002-05-01), Eldridge et al.
patent: 2003/0113990 (2003-06-01), Grube et al.
patent: 2004/0163252 (2004-08-01), Khandros et al.
patent: 2005/0162179 (2005-07-01), Hosaka et al.
patent: 2005/0179456 (2005-08-01), Beaman et al.
patent: WO 2005/122240 (2005-12-01), None
European Patent Office, “Notification of Transmittal of the International Search Report and the Written Opinion of the International Searching Authority, or the Declaration”, International application No. PCT/US2007/005145, dated Oct. 4, 2007, 13 pages.
Claims, International application No. PCT/US2007/005145, 4 pages.

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