Beam alignment in spectroscopic microscopes

Details Beam alignment in spectroscopic microscopes Beam alignment in spectroscopic microscopes

2006-01-13

2008-12-02

Toatley, Gregory J (Department: 2877)

Optics: measuring and testing

By dispersed light spectroscopy

Utilizing a spectrometer

C356S302000, C356S399000

Reexamination Certificate

active

07460229

ABSTRACT:
A spectroscopic microscope includes a laser or other light source which emits light from the entrance aperture of its spectrograph, and also includes a light sensor situated on the microscope sample stage upon which a specimen is to be situated for microscopic/spectrometric analysis. The sample stage is positioned such that the signal from the light sensor is maximized, thereby indicating good alignment between the sample stage and spectrograph. Additionally, the microscope sample stage bears a light source which can emit light to be detected by a light sensor situated at the vantage point of a user/viewer utilizing the microscope, and such a light sensor can simply take the form of a video camera or other image recordation unit associated with the microscope. The sample stage can also be positioned to optimize the signal at the light sensor to signify good alignment between the sample stage and the microscope.

REFERENCES:
patent: 4630925 (1986-12-01), Schiller et al.
patent: 5672816 (1997-09-01), Park et al.
patent: 6661509 (2003-12-01), Deck et al.

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