Batch-test method using a chip tray

Details Batch-test method using a chip tray Batch-test method using a chip tray

2011-03-29

2011-03-29

Nguyen, Ha Tran T (Department: 2858)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S750220, C324S757010, C324S759030

Reexamination Certificate

active

07915903

ABSTRACT:
A chip test method is disclosed and includes: loading chips on a chip tray and fastening a cover plate on the chip tray; loading the chip tray with the cover plate in a chip test device; aligning a probe card of the chip test device with a test unit of the chip tray; testing chips in the chip tray; sorting the passed chips from the failed chips.

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