Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2005-08-30
2005-08-30
Karlsen, Ernest (Department: 2829)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
C324S755090, C324S765010
Reexamination Certificate
active
06937044
ABSTRACT:
A bare semiconductor circuit die carrier is provided for use in the test of semiconductor circuits, the carrier, comprising: a substrate defining an opening and an outer perimeter; a multiplicity of I/O pads disposed about the perimeter; an interconnect circuit which includes a composite of a multiplicity of individual electrical conductors which are formed in a polymer dielectric; wherein the interconnect circuit overlays a top surface of the substrate and extends across the opening so as to form a flexible membrane that spans the opening; a multiplicity of die contact pads connected to the conductors are disposed about the flexible membrane with particles deposited on the die contact pads; a fence upstanding from the membrane and sized to receive a test die; a top cap that rests upon the die when the die is received within the fence; a bottom cap that rests against a bottom surface of the substrate; and a fastener for securing the top cap to the bottom cap with the die disposed therebetween.
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“Decal Contactor With Decoder”, author unknown, Reseaarch Disclosure, No. 32636, Jun. 1991.
Known-Good Die: A Key to Cost Effective “MCMs”, Electronic Packaging and Production by Gene Cloud, Tim Corbett, Jerry Johnson and Alan Wood, Sep. 1992.
Agahdel Fariborz
Griswold Brad
Ho Chung W.
Husain Syed
Moti Robert
Karlsen Ernest
Kulicke & Soffa Industries Inc.
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