Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Patent
1992-11-20
1995-03-28
Snow, Walter E.
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
3241581, G01R 104
Patent
active
054020778
ABSTRACT:
An integrated circuit carrier comprising: a substrate defining an opening and an outer perimeter; a multiplicity of I/O pads disposed about the perimeter; an interconnect circuit which includes a composite of a multiplicity of individual electrical conductors which are formed in a polymer dielectric; wherein the interconnect circuit overlays a top surface of the substrate and extends across the opening so as to span the opening; a multiplicity of die contact pads connected to the conductors are disposed about the flexible polymer dielectric with particles deposited on the die contact pads; a polymer dielectric fence upstanding from the membrane and sized to receive an integrated circuit; a top cap that rests upon the integrated circuit when the integrated circuit is received within the fence; a bottom cap that rests against a bottom surface of the substrate; and a fastener for securing the top cap to the bottom cap with the integrated circuit disposed therebetween.
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"Known-Good Die: A Key to Cost-Effective MCMs", Electronic Packaging and Production by Gene Cloud, Tim Corbett, Jerry Johnson and Alan Wood, Sep. 1992.
Agahdel Fariborz
Griswold Brad
Ho Chung W.
Husain Syed
Moti Robert
Bowser Barry C.
MicroModule Systems Inc.
Snow Walter E.
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