Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Patent
1997-02-18
1999-09-14
Brown, Glenn W.
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
324754, 324765, 414935, G01R 3126, B65G 4907
Patent
active
059528419
ABSTRACT:
A chip is bonded to a tape for ready handling. A flipping mechanism picks up the chip from the tape and sets it in an inverted state. An aligning/mounting mechanism is adapted to align and accurately mount the chip on associated electrodes of a test board. Another flipping mechanism re-sets a post-tested chip onto the tape conveyed by a conveying mechanism.
REFERENCES:
patent: 4956605 (1990-09-01), Bickford et al.
patent: 5189363 (1993-02-01), Bregman et al.
patent: 5510724 (1996-04-01), Itoyama et al.
patent: 5561386 (1996-10-01), Funaki et al.
patent: 5578919 (1996-11-01), Semba et al.
patent: 5614837 (1997-03-01), Itoyama et al.
Brown Glenn W.
Kabushiki Kaisha Toshiba
LandOfFree
Bare chip prober device does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Bare chip prober device, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Bare chip prober device will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-1513504