Bar code interrogation system

Details Bar code interrogation system Bar code interrogation system

2007-05-22

2007-05-22

Hirshfeld, Andrew H. (Department: 2858)

Electricity: measuring and testing

Impedance, admittance or other quantities representative of...

Distributive type parameters

C324S642000

Reexamination Certificate

active

11450554

ABSTRACT:
Presented is a system and method for reading a microwave readable barcode formed from a pattern of dielectric material. The dielectric pattern creates a strong microwave contrast with the surrounding media selectively resonating with or scattering an interrogating microwave signal. Dielectric bars can be fabricated by inkjet printing, injection, spraying, drawing or any other technique. Barcode information is encoded using different lengths, angles, or positions of dielectric bars. A microwave readable dielectric barcode system includes a barcode fabricated from a dielectric material, a transmitter with an antenna, and a sensor that senses the effect produced by the dielectric barcode on the microwave signal. The dielectric barcode system can use multiple microwave signals that differ in one or more respects, such as polarization or frequency.

REFERENCES:
patent: 6184828 (2001-02-01), Shoki
patent: 6330939 (2001-12-01), Pratt
patent: 6427922 (2002-08-01), Marchand
patent: 6526984 (2003-03-01), Nilsson et al.
patent: 6734420 (2004-05-01), Empedocles et al.
patent: 6753830 (2004-06-01), Gelbman
patent: 6819244 (2004-11-01), Dukler et al.
patent: 2004/0026684 (2004-02-01), Empedocles
patent: 1 065 623 (2001-01-01), None
Choong-Rae Cho, et al., Thickness dependent performance of Na0.5K0.5NbO3/sapphire thin film varactors;Integrated Ferroelectrics, 2001, vol. 39, pp. 403-410.
Choong-Rae Choa, et al., Ferroelectric Na0.5K0.5NbO3 Thin Films by Pulsed Laser Deposition;Integrated Ferroelectrics, 2000, vol. 31, pp. 35-46; pp. 35[351]-45[361].
M. Ahtee, et al.; Structural Phase Transitions in Sodium-Potassium Niobate Solid Solutions by Neutron Powder Diffraction;Acta Cryst., 1978, A34, 309-317.
Choong-Rae Choa), et al., Na0.5K0.5NbO3thin films for voltage controlled acoustoelectric device applications,Applied Physics Letters, Apr. 29, 2002, vol. 80, No. 17, pp. 3171-1763.
S. Abadeia), et. al., Low-frequency and microwave performances of laser-ablated epitaxial Na0.5K0.5NbO3films on high-resistivity SiO2/Si substrates;Journal of Applied Physics; Feb. 15, 2002, vol. 91, No. 4, pp. 2267-2276.
Choong-Rae Cho, et. al., Na0.5K0.5NbO3/SiO2/Si thin film varactor;Applied Physics Letters, Mar. 27, 2000, vol. 76, No. 13, pp. 1761-1763.
Jang-Yong Kim, et al., Na0.5K0.5NbO3 Film Microwave Varactors;Integrated Ferroelectrics, 2004, vol. 66, pp. 291-300.
Choong-Rae Cho, et al., Background oxygen effects on pulsed laser deposited Na0.5K0.5NbO3films: from superparaelectric state to ferroelectricity,Journal of Applied Physiscs, May 1, 2000, vol. 87, No. 9, pp. 4439-4448.
S. Abadeia), DC field dependent properties of Na0.5K0.5NbO3/SiO2/Si structures at millimeter-wave frequencies;Applied Physics Letters, Mar. 26, 2001, vol. 78, No. 13, pp. 1900-2276.
Ramos M. Mays; Microwave Readable Ferroelectric Barcode; pp. 1-66.
Alexander M. Grishin, et. al., Processing and On-Wafer Measurements of Ferroelectric Intergitated Tunable Microwave Capacitors; Mat. Res. Soc. Symp. Proc., 2004, vol. 811, pp. D10.1.1-D10.1.6.
Choong-Rae Cho, et al., Self-assembling ferroelectric Na0.5K0.5NbO3thin films by pulsed-laser deposition,Applied Physics Letters, Jul. 12, 1999, vol. 75, No. 2, pp. 268-270.

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