Coded data generation or conversion – Converter calibration or testing
Reexamination Certificate
2011-03-29
2011-03-29
JeanPierre, Peguy (Department: 2819)
Coded data generation or conversion
Converter calibration or testing
C341S155000
Reexamination Certificate
active
07916051
ABSTRACT:
With high speed, high resolution time-interleaved (TI) analog-to-digital converters (ADCs), bandwidth mismatches between the various ADC branches can pose a significant problem. Previously, though, no adequate solution has been found. Here, a method and apparatus are provided that can calculate and compensate for bandwidth mismatches in a TI ADC, enabling a high speed, high resolution TI ADC to be produced.
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Mujica Fernando A.
Sestok Charles K.
Brady III Wade J.
Jean-Pierre Peguy
Patti John J.
Telecky Jr Frederick J.
Texas Instuments Incorporated
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