Band matching system and method for enabling accurate determinat

Details Band matching system and method for enabling accurate determinat Band matching system and method for enabling accurate determinat

1995-04-27

1996-07-09

Turner, Samuel A.

Optics: measuring and testing

By particle light scattering

With photocell detection

356359, 382266, G01B 902

Patent

active

055350020

ABSTRACT:
A band matching system and method (213a) enables accurate determination of a disparity between two surfaces using an interferometer. The band matching system and method (213a) can be implemented in an automatic inspection system (90) for contactlessly measuring undercut or protrusion of an optical fiber (26) relative to a surrounding support material (36) at the endface (79) of an optical fiber termination (37). The inspection system (90) measures an offset of the fringe (113') at the target (82) in the image in order to determine the disparity. In structure, the inspection system (90) has a measurement apparatus (91) with an interferometer (98) controlled by a machine vision system (92) for determining the degree of disparity. Further, the machine vision system (92) employs the band matching system and method (213a) for enhancing the performance of the inspection system (90) and the ultimate calculation of the disparity.

REFERENCES:
patent: 4738507 (1988-04-01), Palmquist
patent: 4738508 (1988-04-01), Palmquist
patent: 4787698 (1988-11-01), Lyons et al.
"CHECKMATE F5 SYSTEM Instruction Manual," Oyokoden Lab Co., Ltd. (at least as early as 1991).
"Norland Fiber Interferometer," Norland Products Inc., New Brunswick, NJ (1992).
"ZX-1 ZOOM INTERFEROMETERS," Direct Optical Research Company, Phoenix, AZ (at least as early as Jan. 1995).
"TOPO-3D Quick Tour Manual," Wyko Corporation, Tucson, AZ., Ltd. (Feb. 1990).

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