Band distribution inspecting device and band distribution...

Electricity: measuring and testing – Measuring – testing – or sensing electricity – per se – Analysis of complex waves

Reexamination Certificate

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C702S066000, C702S190000

Reexamination Certificate

active

07071675

ABSTRACT:
An object of this invention is to provide a band distribution inspecting device and band distribution inspecting method capable of carrying out inspection on whether or not a scattered oscillation signal oscillated containing a frequency variation from the fundamental frequency with the fundamental frequency as a reference point has a band distribution rapidly, with a simple way and at a cheap price. A scattered oscillation signal SSS inputted to a band distribution detecting section22is outputted as a predetermined band pass signal SBP through a band pass filter17having a predetermined pass band of a predetermined narrow-band width Δf within a band distribution. This signal is converted to a root-mean-square value by a smoother19, smoothed by a capacitor C1and transferred to a general purpose inspecting device21as a DC signal SAV. The DC signal SAV is compared with a predetermined voltage value VX by a comparator25and its comparison result is judged by a judging section25and then, an inspection result is outputted as a judging signal J. As a result, an edge frequency in the band distribution of the scattered oscillation signal SSS and disturbance of frequency variation within/out of the band and dullness in waveform and the like can be inspected for.

REFERENCES:
patent: 4339711 (1982-07-01), Inami et al.
patent: 4973897 (1990-11-01), Ohsawa
patent: 6811291 (2004-11-01), Short, III

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