Ballast monitoring for radio frequency power transistors

Details Ballast monitoring for radio frequency power transistors Ballast monitoring for radio frequency power transistors

1997-01-22

1999-05-25

Saadat, Mahshid

Active solid-state devices (e.g., transistors, solid-state diode

Bipolar transistor structure

With enlarged emitter area

257163, 257164, 257578, 257579, 257581, 257582, H01L 27082, H01L 27102, H01L 2970, H01L 3111

Patent

active

059071800

ABSTRACT:
The present invention, generally speaking, provides an apparatus and method whereby the current flow through an RF power transistor may be monitored without the use of any external parts. More particularly, in accordance with one embodiment of the invention, an RF power transistor includes a silicon die, a pair of interdigitated electrodes formed on the silicon die, each having a multiplicity of parallel electrode fingers and at least one bond pad. Regions of a first type of diffusion are formed beneath electrode fingers of one electrode of the pair of interdigitated electrodes, and regions of a second type of diffusion are formed beneath electrode fingers of another electrode of the pair of interdigitated electrodes. One electrode has multiple electrode fingers and multiple resistors formed on the silicon die, at least one resistor connected in series with each one of the electrode fingers. A further electrode is provided having at least one electrode finger and connected to a further bond pad, and at least one resistor is formed on the silicon die and connected in series with the further electrode. In accordance with another embodiment of the invention, a method is provided for monitoring and controlling current flow in an integrated RF transistor within an RF transistor circuit. The integrated RF transistor has multiple emitter ballast resistors and a circuit, including a bond pad for monitoring current flow. The RF transistor circuit includes a bias control and feedback circuit connected to the bond pad. Current flowing through at least one of the emitter ballast resistors is routed to the circuit for monitoring current flow. Using the bias control and feedback circuit, the current flowing through the integrated RF transistor is influenced.

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