Electricity: measuring and testing – Impedance – admittance or other quantities representative of...
Reexamination Certificate
2006-04-25
2006-04-25
Nguyen, Vincent Q. (Department: 2858)
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
C324S650000
Reexamination Certificate
active
07034548
ABSTRACT:
A test system and method characterize a balanced device under test (DUT) with a vector network analyzer (VNA) measurement system using a differential or balanced stimulus signal and further calibrate the VNA using conventional calibration standards. An effect of errors introduced by an uncalibrated portion of the measurement system, such as test fixturing and hybrid junction coupling, is de-embedded from measured S-parameters for the DUT. The method includes calibrating the VNA, characterizing the uncalibrated portion, measuring S-parameters for the DUT with the calibrated VNA, and de-embedding the uncalibrated portion characterization from the S-parameter measurements. The test system includes a multiport VNA measurement system that includes a hybrid coupler, an optional test fixture, and a computer program. A processor executes the computer program. Instructions of the computer program implement the method.
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Agilent Technologie,s Inc.
Nguyen Vincent Q.
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