Badbit counter for memory testing

Details Badbit counter for memory testing Badbit counter for memory testing

1988-10-24

1990-07-17

Atkinson, Charles E.

Excavating

365200, 365201, 371 51, 371 251, G01R 3128

Patent

active

049425765

ABSTRACT:
Apparatus for comparing outputs of two digital devices and counting digital aberrations between them. One embodiment of this invention is the use of an XOR gate to compare the output of a DRAM under test to the output of a known good DRAM of corresponding operating characteristics, and the use of a counter to count the digital aberrations, known as badbits, between the two DRAMs.

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patent: 4791357 (1988-12-01), Hijduke

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