Radiant energy – Electron energy analysis
Reexamination Certificate
2006-02-28
2006-02-28
Ngô, Ngân V. (Department: 2818)
Radiant energy
Electron energy analysis
C250S338400, C257S443000
Reexamination Certificate
active
07005637
ABSTRACT:
Backthinning in an area selective manner is applied to imaging sensors12for use in electron bombarded devices. A further arrangement results in an array of collimators51aligned with pixels42or groups of pixels providing improved image contrast of such image sensor. Provision of a thin P-doped layer52on the illuminated rear surface provides both a diffusion barrier resulting in improved resolution and a functional shield for reference pixels. A gradient in concentration of P-doped layer52optimizes electron collection at the pixel array.
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Brown David W.
Chung Yun
Costello Kenneth A
Fairbairn Kevin P.
Gober Patricia
Cole Stanley Z
Intevac, Inc.
Ngo Ngan V.
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