Backside gettering of silicon wafers utilizing selectively annea

Metal treatment – Compositions – Heat treating

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29576T, 29576W, 148174, 148175, 148DIG3, 148DIG24, 148DIG48, 148DIG60, 148DIG61, 148DIG71, 357 59, H01L 21263, H01L 21324

Patent

active

045590869

ABSTRACT:
There is disclosed a process and the resulting semiconductor wafer wherein the backside of the wafer has applied thereto a layer of polysilicon. Portions of this layer are exposed to an energy beam to recrystallize them into single crystal silicon fused to and extending from the underlying wafer. The recrystallized portions contact adjacent portions of the polysilicon layer, thereby providing a path for impurities migrating from the wafer to the polysilicon.

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patent: 4377421 (1983-03-01), Wada et al.
Beyer et al., "Gettering and Barrier Technique", I.B.M. Tech. Discl. Bull., vol. 19, No. 6, Nov. 1976, pp. 2050-2051.
Poponiak et al, "Gettering Utilizing--Disordered Epitaxial Layer", I.B.M. Tech. Discl. Bull., vol. 19, No. 6, Nov. 1976, pp. 2052-2053.

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