Telephonic communications – Diagnostic testing – malfunction indication – or electrical... – With blocking of normal usage
Reexamination Certificate
1998-07-22
2001-04-17
Nguyen, Duc (Department: 2643)
Telephonic communications
Diagnostic testing, malfunction indication, or electrical...
With blocking of normal usage
C379S027010, C379S029010
Reexamination Certificate
active
06219406
ABSTRACT:
BACKGROUND OF THE INVENTION
1. Field of the Invention
The present invention relates to a back wiring board and an aggregated device of back wiring boards, and in particular to a back wiring board which connects a printed board package mounted thereon to testing equipments (testers) and an aggregated device thereof.
In recent years, an electronic device has been required to have not only a high-performance and a high-quality but also a low price and a compactness. In order to reduce the price of e.g. a switchboard system in its entirety and to compact same, the connection and the arrangement of units such as a subscriber circuit unit and a testing unit are important constitutional elements.
2. Related Prior Art
FIG. 17
shows an arrangement (
1
) of a switchboard system having the prior art back wiring board as a component. This switchboard system is mainly composed of a communication channel system, a central processing system, and an I/O system.
The communication channel system has a subscriber circuit (SLC) shelf
210
connected to telephones
100
a
-
100
n
. The central processing system has a switching unit (SW)
400
connected to the subscriber circuit shelf
210
and a central processing unit (CC)
410
connected to the switching unit
400
. The I/O system has a terminal equipment
420
connected to the central processing unit
410
.
The subscriber circuit shelf
210
is composed of subscriber circuit units
212
a
-
212
n
respectively connected to the telephones
100
a
-
100
n,
a selector
211
connected in parallel with the subscriber circuit units
212
a
-
212
n
by means of a conductor pattern PP on a back wiring board (not shown), and a common line trunk
214
connected to the subscriber circuit units
212
a
-
212
n
and the selector
211
through the back wiring board and connected to the switching unit
400
.
A jumper terminal frame (JPTF) is connected to the selector
211
through connectors CNa, CNb with a cable CBL, and is connected to testers
300
a
-
300
m
through a cable CBL
1
.
The subscriber circuit units
212
a
-
212
n
are respectively composed of relays RL
1
, RL
2
respectively connected in cascade connection to the telephones
100
a
-
100
n
and a subscriber circuit (SLC)
2121
. The relays RL
1
, RL
2
are connected to the selector
211
through the conductor pattern PP on the back wiring board. The selector
211
is composed of relays RL
3
, RL
4
selectively connecting the conductor pattern PP to the connectors CNa, CNb.
In operation, the relays RL
1
, RL
2
are normally preset so that the telephones
100
a
-
100
n
may be respectively connected to the subscriber circuit
2121
in each of the subscriber circuit units
212
a
-
212
n.
When the subscriber circuit unit
212
n
is to be tested or examined with the tester
300
m
as one example, a terminal connected to the tester
300
m
is connected to a terminal connected to the selector
211
by means of lapping in the jumper terminal frame
900
. After the connection, the terminal equipment
420
transmits a test demand signal to the subscriber circuit unit
212
n
and the selector
211
through the central processing unit
410
, the switching portion
400
, and the common line trunk
214
.
In response to the test demand signal, the subscriber circuit unit
212
n
disconnects the telephone
100
n
from the subscriber circuit
2121
and switches over the relays RL
1
, RL
2
so that the telephone
100
n
and the subscriber circuit
2121
as disconnected may be connected to the conductor pattern PP on the back wiring board. Also, in response to the test demand signal, the selector
211
properly turns on the relays RL
3
, RL
4
so that the conductor pattern PP may be connected to the tester
300
m
through the jumper terminal frame
900
.
As a result, the tester
300
m
is now connected to the telephone
100
n
and the subscriber circuit
2121
of the subscriber circuit unit
212
n
. After the execution of a predetermined test, the tester
300
m
transmits the test result to the terminal equipment
420
through the switching portion
400
and the central processing unit
410
.
FIG. 18
shows an arrangement (
2
) of such a switchboard having the prior art back wiring board and the aggregated device thereof as components.
In this arrangement (
2
), different from the arrangement (
1
) of
FIG. 17
, the back wiring board (not shown) mounting the selector
211
within each of the subscriber circuit shelves
210
a
-
210
j
and the back wiring board (not shown) mounting the selector
211
within each of the subscriber circuit shelves
210
k
-
210
p
form selection groups
200
a,
200
b
which are respectively the aggregated devices of the back wiring boards.
Also, different from the arrangement (
1
), the selectors
211
within the subscriber circuit shelves
210
a
-
210
j
and the jumper terminal frame
900
a
are mutually connected with a cable CBLa through the connectors CNa, CNb, and the selectors
211
within the subscriber circuit shelves
210
k
-
210
p
and the jumper terminal frame
900
b
are mutually connected with a cable CBLb through the connectors CNa, CNb.
In operation when the subscriber circuit
2121
and the telephone
100
(see
FIG. 17
) connected to the selector
211
in the subscriber circuit shelf
210
p
in the selection group
200
b
are tested by the tester
100
m
as an example, after the connection by the jumper terminal frame
900
b,
the tester
300
m
is connected to the telephone
100
and the subscriber circuit
2121
disconnected as above-noted through the cable CBL
1
b,
the jumper terminal frame
900
b,
and the cable CBLb.
As a result, the tester
300
m
is capable of testing the telephone
100
and the subscriber circuit
2121
. Likewise, the other subscriber circuits
2121
in the selection group
200
b
can be tested with any one of the testers
300
a
-
300
m.
Namely, in the selection group
200
b
, the testers
300
a
-
300
m
can be commonly used for the subscriber circuits within the subscriber circuit units.
Also in the selection group
200
a,
the testers
300
a
-
300
m
belonging to this selection group
200
a
can be connected to the subscriber circuits
2121
belonging to the shelves
210
a
-
210
j
through the cable CBL
1
a,
the jumper terminal frame
900
a,
and the cable CBLa to perform the test.
FIG. 19A
shows a mounted example of shelves in the prior art switchboard, which are composed of two control system shelves
230
, five subscriber circuit shelves
210
, and a single jumper terminal frame shelf
900
.
Such a switchboard having the prior art back wiring board and the aggregated device as the components requires the jumper terminal frame
900
(see
FIG. 19A
) between the selector connected to the subscriber circuit and the testers, as shown in
FIGS. 17 and 18
, in order to test the subscriber circuits.
The jumper terminal frame
900
has a subject of compactness due to the occupation of a certain mounting space.
Also, the connection in the jumper terminal frame
900
possibly becomes erroneous because a maintenance person does so manually by means of lapping etc.
Moreover, each of the selection groups as shown in
FIG. 18
have 2000-3000 subscriber lines so that it is necessary to connect at least one tester of a high-price and a high-performance in addition to relatively cheap testers of a simple performance to the selection groups.
SUMMARY OF THE INVENTION
It is accordingly an object of the present invention to provide a back wiring board mounting a printed board package and an aggregated device of back wiring boards, which is made compact and free from a manual connection error, and reduced in the total number of testers mounted thereon.
For the achievement of the above-noted object, a back wiring board according to the present invention comprises an adapter connector to be connected to testers, a receiving portion for a test demand signal from an external controller, and a selector for selecting one of the testers, according to the test demand signal, which is to be connected to the printed board package.
FIG. 1
shows a schematic arrangement
Hamanaka Naoto
Kobayashi Toshitsugu
Maruyama Kazuyoshi
Nakashima Naoyuki
Tanaka Masahiro
Fujitsu Limited
Helfgott & Karas P.C.
Nguyen Duc
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