Back side probing method and assembly

Details Back side probing method and assembly Back side probing method and assembly

2005-12-27

2005-12-27

Patel, Paresh (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S754090, C324S765010

Reexamination Certificate

active

06980015

ABSTRACT:
An interface board for probing a device under test having a having an array of connection points on a back side of a board to which the device under test is attached. The interface board is constructed upon a stiff layer having a plurality of pass throughs from a first side to a second side in a pattern matching the array of connection points on the board to which the device under test is attached. An array of pads are formed on a first side of the interface board, each pad having a controlled surface associated with one of the pass throughs.

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