Azimuth measuring device

Data processing: measuring – calibrating – or testing – Calibration or correction system – Direction

Reexamination Certificate

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Details

C702S094000, C702S095000

Reexamination Certificate

active

10583870

ABSTRACT:
An azimuth measuring device is provided that can obtain offset information when the direction of the azimuth measuring device is arbitrarily changed. The offset information is calculated based on coordinates of a reference point obtained by a reference point estimating system. The azimuth measuring device can obtain the offset information without obtaining erroneous offset information when changing direction.

REFERENCES:
patent: 1422942 (1922-07-01), Eberly
patent: 4497034 (1985-01-01), Kuno et al.
patent: 7177779 (2007-02-01), Hikida et al.
patent: 2005/0256673 (2005-11-01), Hikida et al.
patent: 2005/0283988 (2005-12-01), Sato et al.
patent: 2006/0021238 (2006-02-01), Sato et al.
patent: 2006/0031014 (2006-02-01), Sato et al.
patent: 2006/0066295 (2006-03-01), Tamura et al.
patent: 2006/0270903 (2006-11-01), Uchiyama et al.
patent: 2007/0033818 (2007-02-01), Kitamura et al.
patent: 61-147104 (1986-07-01), None
patent: 62-255814 (1987-11-01), None
patent: 64-046610 (1989-02-01), None
patent: 1-173614 (1989-12-01), None
patent: 03-048713 (1991-03-01), None
patent: 03-154821 (1991-07-01), None
patent: 08-105745 (1996-04-01), None
patent: 08-313261 (1996-11-01), None
patent: 10-132568 (1998-05-01), None
patent: 2000-131068 (2000-05-01), None
patent: 2003-035010 (2003-02-01), None
patent: 2003-042766 (2003-02-01), None
patent: 2003-065791 (2003-03-01), None
patent: 2004-309228 (2004-11-01), None
patent: WO 2004/003476 (2004-01-01), None
International Preliminary Report on Patentability in International Application No. PCT/JP2004/018888, dated Aug. 22, 2006, 6 pages.
International Search Report in International Application No. PCT/JP2004/018888, dated Mar. 29, 2006, 1 page.
Office Action in co-pending U.S. Appl. No. 10/563,128, filed Jun. 8, 2007 (Ex. Kundu).
Official Notice of Rejection of Korean Patent Office for corresponding Korean Patent Application No. 10-2006-7000029, dated Jun. 28, 2007.

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