Data processing: measuring – calibrating – or testing – Measurement system – Measured signal processing
Reexamination Certificate
2008-07-15
2008-07-15
Barbee, Manuel L. (Department: 2857)
Data processing: measuring, calibrating, or testing
Measurement system
Measured signal processing
C702S080000
Reexamination Certificate
active
10338326
ABSTRACT:
A recording of a first selectable process signal of a system is indexed by a second process signal that is different from the timing signal of the system. First process signals acquired in this way are stored in a memory as a function of the index-forming second process signal, wherein a measurement value represented by a first process signal is distributed over adjacent memory locations of the memory if the first acquired process signal has a non-integer index.
REFERENCES:
patent: 4226122 (1980-10-01), Lund et al.
patent: 4908825 (1990-03-01), Vea
patent: 6519536 (2003-02-01), Brunacci et al.
patent: 2004/0012874 (2004-01-01), Chainer et al.
patent: WO 87/07026 (1986-05-01), None
patent: WO87/07026 (1986-05-01), None
patent: WO 87/07026 (1987-11-01), None
patent: WO87/07026 (1987-11-01), None
Tagungsband Messcomp '92, Messen und Verabeiten elektrischer und nichtelektrischer Groössen, Sep. 07-09, 1992, Wiesbaden, pp. 133-138.
Barbee Manuel L.
Feiereisen Henry M.
Siemens Aktiengesellschaft
LandOfFree
Averaging trace function with indexing by a process signal does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Averaging trace function with indexing by a process signal, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Averaging trace function with indexing by a process signal will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3918184