Avalanche testing at final test of top and bottom FETs of a...

Details Avalanche testing at final test of top and bottom FETs of a... Avalanche testing at final test of top and bottom FETs of a...

2008-05-06

2008-05-06

Nguyen, Ha Tran (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S110000

Reexamination Certificate

active

11342893

ABSTRACT:
An avalanche test circuit for applying an avalanche test signal to a device under test, comprising a series combination of a voltage source and an inductance; a switching device connected in parallel with said series combination; a diode for being connected to a test terminal of said device under test, said diode being connected to a connection point of said inductance and said switching device; a common terminal of said device under test being connected to a connection point of said switching device and said voltage source.

REFERENCES:
patent: 4754385 (1988-06-01), McDade et al.
patent: 5097196 (1992-03-01), Schoneman
patent: 5408150 (1995-04-01), Wilcox
patent: 5480150 (1996-01-01), Weyand
patent: 6175225 (2001-01-01), De Groot
patent: 6204648 (2001-03-01), Saeki et al.
patent: 6504351 (2003-01-01), Eagar et al.
patent: 7202643 (2007-04-01), Miftakhutdinov
patent: 2006/0232252 (2006-10-01), Walters
“iPOWIR Building Blocks for Multiphase Buck Converters,” www.irf.com.
“iP1203, iPOWIR Building Block for Single Phase Buck Converters,” www.irf.com.
“iP1201 and iP1202: Single/Dual Output Full Function 2-Phase DC-DC Converter Synchronous Buck Power Blocks,” www.irf.com.
“Known Good Die—The SureCHIP Process,” www.irf.com.
McDonald, T., et al., “Power MOSFET Avalanche Design Guidelines,” www.irf.com, Application Note AN-1005, pp. 1-17.

Affiliated with

Also associated with

Rating

Avalanche testing at final test of top and bottom FETs of a... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Avalanche testing at final test of top and bottom FETs of a..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Avalanche testing at final test of top and bottom FETs of a... will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-3917458