Avalanche testing at final test of top and bottom FETs of a...

Details Avalanche testing at final test of top and bottom FETs of a... Avalanche testing at final test of top and bottom FETs of a...

2008-05-06

2008-05-06

Nguyen, Ha Tran (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S110000

Reexamination Certificate

active

07368934

ABSTRACT:
An avalanche test circuit for applying an avalanche test signal to a device under test, comprising a series combination of a voltage source and an inductance; a switching device connected in parallel with said series combination; a diode for being connected to a test terminal of said device under test, said diode being connected to a connection point of said inductance and said switching device; a common terminal of said device under test being connected to a connection point of said switching device and said voltage source.

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McDonald, T., et al., “Power MOSFET Avalanche Design Guidelines,” www.irf.com, Application Note AN-1005, pp. 1-17.

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