Avalanche photodiode with adjacent layers

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357 16, 357 56, 357 4, H01L 2714

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050757504

ABSTRACT:
An avalanche photodiode (APD) includes an InP layer, a carrier multiplication layer, a light-absorbing layer, a light-reflecting layer, and an electrode. The carrier multiplication layer is arranged on one surface of the InP layer and constituted by superlattice in which In.sub.0.52 Al.sub.0.48 As layers and In.sub.x Ga.sub.1-x As.sub.y P.sub.1-y layers to be lattice-matched with the In.sub.0.52 Al.sub.0.48 As layers are alternately stacked. The light-absorbing layer consists of p-type In.sub.0.53 Ga.sub.0.47 As. The light-reflecting layer is arranged on an opposite side of the carrier multiplication layer with respect to the InP layer. The electrode is arranged on the other surface of the InP layer and having a light incident window. The light-absorbing layer is arranged adjacent to the carrier multiplication layer.

REFERENCES:
patent: 4982255 (1991-01-01), Tomita
Capasso et al., "Enhancement of Electron Impact Ionization in a Superlattice: A New Avalanche Photodiode with a Large Ionization Rate Ratio," Appl. Phys. Lett. 40(1), Jan. 1, 1982, pp. 38-40.
Kagawa, "InGaAs/InAlAs Superlattice Photodiode with a Separated Photoabsorption Layer," Appl. Phys. Lett., 57(18), Oct. 29, '90, pp. 1895-1897.
Kagawa et al., "Impact Ionization Rates in an InGaAs/InAlAs Superlattice", Appl. Phys. Lett. vol. 55, No. 10, Sep. 4, 1989, 1989 American Institute of Physics, pp. 993-995.
Kevin Brennan, "Theoretical Study of Multiquantum Well Avalanche Photodiodes Made from the GaInAs/AlInAs Material System", IEEE Transactions on Electron Devices, vol. ED-33, No. 10, Oct. 1986, pp. 1502-1510.
"Impact Ionisation in Multilayered Heterojunction Structures", Electronics Letters, Jun. 5, 1980, vol. 16, No. 12, pp. 467-469, Chin et al.

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