Avalanche capability improvement in power semiconductor...

Active solid-state devices (e.g. – transistors – solid-state diode – Regenerative type switching device – Combined with field effect transistor

Reexamination Certificate

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C257S330000, C438S401000

Reexamination Certificate

active

08072000

ABSTRACT:
A structure of power semiconductor device having dummy cells around edge of active area is disclosed. The UIS test result of said improved structure shows that failed site after UIS test randomly located in active area which means avalanche capability of the semiconductor power device is enhanced by implementation of the dummy cells.

REFERENCES:
patent: 5877528 (1999-03-01), So
patent: 2006/0273385 (2006-12-01), Hshieh
patent: 2008/0035988 (2008-02-01), Hshieh
patent: 2009/0066404 (2009-03-01), Heppenstall et al.
patent: 2009/0250770 (2009-10-01), Su et al.
patent: 2010/0163979 (2010-07-01), Hebert

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