Availability, reliability or maintainability index including...

Data processing: measuring – calibrating – or testing – Measurement system – Performance or efficiency evaluation

Reexamination Certificate

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Details

C702S182000, C702S187000, C702S179000, C702S081000, C709S224000, C700S090000, C700S108000, C700S111000

Reexamination Certificate

active

06901347

ABSTRACT:
Improved reliability, availability and/or maintainability metrics have been developed that account for customer perceived factors such as frequency of outage, duration of outages, business impact of outages, etc. In various realizations and exploitations, such improved metrics may be utilized for managing and/or monitoring availability of enterprise information services or suites, availability of individual computers, devices or facilities, and/or availability of particular functionality or subsystems of any of the above. In one exploitation, personnel management decisions and/or compensation levels may be based on achieved values for such improved metrics. In other exploitations, contractual commitments and/or incentive fees related to an installed system or systems may be based on such improved metrics.

REFERENCES:
patent: 5031124 (1991-07-01), Bosinoff et al.
Tyco Electronics, Reliability Prediction of Board-Mounted Power Modules Jul. 1997, Tyco, pp. 1-6.*
Barringer, Life Cycle Cost & Reliability for Process Equipment Jan. 1997, American Petroleum Institute, 8thVolume, pp. 1-22.*
Colby, LEAP Fine Timing Hardware and Software Status Jan. 1998, Standford University, pp. 1-3.*
Barringer, Availability, Reliability, Maintainability and Capability Feb. 18, 1997, TCTVI, pp. 1-11.*
Sun Microsystems Pairs Sun Enterprise SyMON with Leading System Management Solutions for Greater Levels of Availability, Sun Microsystems, Inc., Palo Alto, CA. Press Release Feb. 9, 1999, [online] [printed on Feb. 9, 2000] 3 pages. Retrieved from the Internet: <URL: http://www.sun.com/smi/Press/sunflash/1999-02/sunflash.990209.1.html>.
Sun Sets Agenda on Availability with New SunUP Program, Sun Microsystems Inc., Palo Alto, CA. Press Release Feb. 9, 1999 [online] [printed on Feb. 9, 2000] 4 pages. Retrieved from the Internet: <URL: http://www.sun.com/smi/Press/sunflash/1999-02/sunflash.990209.3.html>.
Sun and the Uptime Institute Join Forces, Enabling Customers to Track and Correct Causes of Downtime, Sun Microsystems, Inc., Palo Alto, CA. Press Release Feb. 9, 1999, [online] [printed on Feb. 9, 1999] 3 pages. Retrieved from the Internet: <URL: http://www.sun.com/smi/Press/sunflash/1999-02/sunflash.990209.6.html>.
SunUP: Sun's Availability Program, Sun Microsystems, Inc., Palo Alto, CA. White Paper, Mar. 1999, pp. 1-19.
Siewiorek, Daniel P. and Swarz, Robert S., Evaluation Criteria, The Theory and Practice of Reliable System Design, 1982, pp. I, II, 201-297, Digital Press, Educational Services, Digital Equipment Corporation, Bedford, Massachusetts.

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